Atomic Force Microscopy
Our laboratory is equipped with a set of SPM devices to determine the topography down to subnanometer resolution. Using our NT-MDT NTEGRA and Park Systems (PSIA) XE-100 microscopes employing functionalized tips, electronic (STM), magnetic (MFM), topological (AFM), and thermal properties are obtained as a function of the surface coordinates. Measurements are performed with latest technology and with high accuracy, minimizing mechanical effects on the tested specimens.
The following measurement services are available:
- Topography
- Roughness analysis
- Mapping of thermal, magnetic, and electronic properties
- Thermal transitions in polymers
